Tip‐enhanced Raman spectroscopy of 6H‐SiC with graphene adlayers: selective suppression of E1 modes
KF Domke, B Pettinger - … Journal for Original Work in all …, 2009 - Wiley Online Library
We have characterized 6H‐SiC substrates with tip‐enhanced Raman spectroscopy in a
broad spectral range between 100 and 3000 cm− 1. A few adlayers of graphene previously
grown on the semiconductor's C surface enabled us to approach the Au tip of a scanning …
broad spectral range between 100 and 3000 cm− 1. A few adlayers of graphene previously
grown on the semiconductor's C surface enabled us to approach the Au tip of a scanning …
